Method of programming memory cells of series strings of memory cells

ABSTRACT

Method of programming memory cells of series strings of memory cells include programming a target memory cell of a series string of memory cells after programming each memory cell of the string located between the target memory cell and a first end of the string, and verifying the programming of the target memory cell by applying a bias at a second end of the string opposite the first end and sensing a voltage developed at the first end in response to the bias.

RELATED APPLICATION

This application is a continuation of U.S. patent application Ser. No. 11/973,677, filed Oct. 10, 2007 and titled “PROGRAMMING SEQUENCE IN NAND MEMORY,” which is commonly assigned and incorporated by reference in its entirety herein.

TECHNICAL FIELD

The present disclosure relates generally to semiconductor memory, and in particular, the present disclosure relates to solid state non-volatile memory devices and systems utilizing analog signals to communicate data values of two or more bits of information.

BACKGROUND

Electronic devices commonly have some type of bulk storage device available to them. A common example is a hard disk drive (HDD). HDDs are capable of large amounts of storage at relatively low cost, with current consumer HDDs available with over one terabyte of capacity.

HDDs generally store data on rotating magnetic media or platters. Data is typically stored as a pattern of magnetic flux reversals on the platters. To write data to a typical HDD, the platter is rotated at high speed while a write head floating above the platter generates a series of magnetic pulses to align magnetic particles on the platter to represent the data. To read data from a typical HDD, resistance changes are induced in a magnetoresistive read head as it floats above the platter rotated at high speed. In practice, the resulting data signal is an analog signal whose peaks and valleys are the result of the magnetic flux reversals of the data pattern. Digital signal processing techniques called partial response maximum likelihood (PRML) are then used to sample the analog data signal to determine the likely data pattern responsible for generating the data signal.

HDDs have certain drawbacks due to their mechanical nature. HDDs are susceptible to damage or excessive read/write errors due to shock, vibration or strong magnetic fields. In addition, they are relatively large users of power in portable electronic devices.

Another example of a bulk storage device is a solid state drive (SSD). Instead of storing data on rotating media, SSDs utilize semiconductor memory devices to store their data, but include an interface and form factor making them appear to their host system as if they are a typical HDD. The memory devices of SSDs are typically non-volatile flash memory devices.

Flash memory devices have developed into a popular source of non-volatile memory for a wide range of electronic applications. Flash memory devices typically use a one-transistor memory cell that allows for high memory densities, high reliability, and low power consumption. Changes in threshold voltage of the cells, through programming of charge storage or trapping layers or other physical phenomena, determine the data value of each cell. Common uses for flash memory and other non-volatile memory include personal computers, personal digital assistants (PDAs), digital cameras, digital media players, digital recorders, games, appliances, vehicles, wireless devices, mobile telephones, and removable memory modules, and the uses for non-volatile memory continue to expand.

Unlike HDDs, the operation of SSDs is generally not subject to vibration, shock or magnetic field concerns due to their solid state nature. Similarly, without moving parts, SSDs have lower power requirements than HDDs. However, SSDs currently have much lower storage capacities compared to HDDs of the same form factor and a significantly higher cost per bit.

For the reasons stated above, and for other reasons which will become apparent to those skilled in the art upon reading and understanding the present specification, there is a need in the art for alternative bulk storage options.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a simplified block diagram of a memory device according to an embodiment of the disclosure.

FIG. 2 is a schematic of a portion of an example NAND memory array as might be found in the memory device of FIG. 1.

FIG. 3 is a block schematic of a solid state bulk storage device in accordance with one embodiment of the present disclosure.

FIG. 4 is a depiction of a wave form showing conceptually a data signal as might be received from the memory device by a read/write channel in accordance with an embodiment of the disclosure.

FIG. 5 is a block schematic of an electronic system in accordance with an embodiment of the disclosure.

FIGS. 6A-6B show diagrams detailing NAND array programming order and voltage sensing in accordance with embodiments of the present invention.

DETAILED DESCRIPTION

In the following detailed description of the present embodiments, reference is made to the accompanying drawings that form a part hereof, and in which is shown by way of illustration specific embodiments in which the embodiments may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention, and it is to be understood that other embodiments may be utilized and that process, electrical or mechanical changes may be made without departing from the scope of the present disclosure. The following detailed description is, therefore, not to be taken in a limiting sense.

Traditional solid-state memory devices pass data in the form of binary signals. Typically, a ground potential represents a first logic level of a bit of data, e.g., a ‘0’ data value, while a supply potential represents a second logic level of a bit of data, e.g., a ‘1’ data value. A multi-level cell (MLC) may be assigned, for example, four different threshold voltage (Vt) ranges of 200 mV for each range, with each range corresponding to a distinct data state, thereby representing four data values or bit patterns. Typically, a dead space or margin of 0.2V to 0.4V is between each range to keep the Vt distributions from overlapping. If the Vt of the cell is within the first range, the cell may be deemed to store a logical 11 state and is typically considered the erased state of the cell. If the Vt is within the second range, the cell may be deemed to store a logical 10 state. If the Vt is within the third range, the cell may be deemed to store a logical 00 state. And if the Vt is within the fourth range, the cell may be deemed to store a logical 01 state.

When programming a traditional MLC device as described above, cells are generally first erased, as a block, to correspond to the erased state. Following erasure of a block of cells, the least-significant bit (LSB) of each cell is first programmed, if necessary. For example, if the LSB is a 1, then no programming is necessary, but if the LSB is a 0, then the Vt of the target memory cell is moved from the Vt range corresponding to the 11 logic state to the Vt range corresponding to the 10 logic state. Following programming of the LSBs, the most-significant bit (MSB) of each cell is programmed in a similar manner, shifting the Vt where necessary. When reading an MLC of a traditional memory device, one or more read operations determine generally into which of the ranges the Vt of the cell voltage falls. For example, a first read operation may determine whether the Vt of the target memory cell is indicative of the MSB being a 1 or a 0 while a second read operation may determine whether the Vt of the target memory cell in indicative of the LSB being a 1 or a 0. In each case, however, a single bit is returned from a read operation of a target memory cell, regardless of how many bits are stored on each cell. This problem of multiple program and read operations becomes increasingly troublesome as more bits are stored on each MLC. Because each such program or read operation is a binary operation, i.e., each programs or returns a single bit of information per cell, storing more bits on each MLC leads to longer operation times.

The memory devices of an illustrative embodiment store data as Vt ranges on the memory cells. In contrast to traditional memory devices, however, program and read operations are capable of utilizing data signals not as discrete bits of MLC data values, but as full representations of MLC data values, such as their complete bit patterns. For example, in a two-bit MLC device, instead of programming a cell's LSB and subsequently programming that cell's MSB, a target threshold voltage may be programmed representing the bit pattern of those two bits. That is, a series of program and verify operations would be applied to a memory cell until that memory cell obtained its target threshold voltage rather than programming to a first threshold voltage for a first bit, shifting to a second threshold voltage for a second bit, etc. Similarly, instead of utilizing multiple read operations to determine each bit stored on a cell, the threshold voltage of the cell may be determined and passed as a single signal representing the complete data value or bit pattern of the cell. The memory devices of the various embodiments do not merely look to whether a memory cell has a threshold voltage above or below some nominal threshold voltage as is done in traditional memory devices. Instead, a voltage signal is generated that is representative of the actual threshold voltage of that memory cell across the continuum of possible threshold voltages. An advantage of this approach becomes more significant as the bits per cell count is increased. For example, if the memory cell were to store eight bits of information, a single read operation would return a single analog data signal representative of eight bits of information.

FIG. 1 is a simplified block diagram of a memory device 101 according to an embodiment of the disclosure. Memory device 101 includes an array of memory cells 104 arranged in rows and columns. Although the various embodiments will be described primarily with reference to NAND memory arrays, the various embodiments are not limited to a specific architecture of the memory array 104. Some examples of other array architectures suitable for the present embodiments include NOR arrays, AND arrays, and virtual ground arrays. In general, however, the embodiments described herein are adaptable to any array architecture permitting generation of a data signal indicative of the threshold voltage of each memory cell.

A row decode circuitry 108 and a column decode circuitry 110 are provided to decode address signals provided to the memory device 101. Address signals are received and decoded to access memory array 104. Memory device 101 also includes input/output (I/O) control circuitry 112 to manage input of commands, addresses and data to the memory device 101 as well as output of data and status information from the memory device 101. An address register 114 is coupled between I/O control circuitry 112 and row decode circuitry 108 and column decode circuitry 110 to latch the address signals prior to decoding. A command register 124 is coupled between I/O control circuitry 112 and control logic 116 to latch incoming commands. Control logic 116 controls access to the memory array 104 in response to the commands and generates status information for the external processor 130. The control logic 116 is coupled to row decode circuitry 108 and column decode circuitry 110 to control the row decode circuitry 108 and column decode circuitry 110 in response to the addresses.

Control logic 116 is also coupled to a sample and hold circuitry 118. The sample and hold circuitry 118 latches data, either incoming or outgoing, in the form of analog voltage levels. For example, the sample and hold circuitry could contain capacitors or other analog storage devices for sampling either an incoming voltage signal representing data to be written to a memory cell or an outgoing voltage signal indicative of the threshold voltage sensed from a memory cell. The sample and hold circuitry 118 may further provide for amplification and/or buffering of the sampled voltage to provide a stronger data signal to an external device.

The handling of analog voltage signals may take an approach similar to an approach well known in the area of CMOS imager technology, where charge levels generated at pixels of the imager in response to incident illumination are stored on capacitors. These charge levels are then converted to voltage signals using a differential amplifier with a reference capacitor as a second input to the differential amplifier. The output of the differential amplifier is then passed to analog-to-digital conversion (ADC) devices to obtain a digital value representative of an intensity of the illumination. In the present embodiments, a charge may be stored on a capacitor in response to subjecting it to a voltage level indicative of an actual or target threshold voltage of a memory cell for reading or programming, respectively, the memory cell. This charge could then be converted to an analog voltage using a differential amplifier having a grounded input or other reference signal as a second input. The output of the differential amplifier could then be passed to the I/O control circuitry 112 for output from the memory device, in the case of a read operation, or used for comparison during one or more verify operations in programming the memory device. It is noted that the I/O control circuitry 112 could optionally include analog-to-digital conversion functionality and digital-to-analog conversion (DAC) functionality to convert read data from an analog signal to a digital bit pattern and to convert write data from a digital bit pattern to an analog signal such that the memory device 101 could be adapted for communication with either an analog or digital data interface.

During a write operation, target memory cells of the memory array 104 are programmed until voltages indicative of their Vt levels match the levels held in the sample and hold circuitry 118. This can be accomplished, as one example, using differential sensing devices to compare the held voltage level to a threshold voltage of the target memory cell. Much like traditional memory programming, programming pulses could be applied to a target memory cell to increase its threshold voltage until reaching or exceeding the desired value. In a read operation, the Vt levels of the target memory cells are passed to the sample and hold circuitry 118 for transfer to an external processor (not shown in FIG. 1) either directly as analog signals or as digitized representations of the analog signals depending upon whether ADC/DAC functionality is provided external to, or within, the memory device.

Threshold voltages of cells may be determined in a variety of manners. For example, a word line voltage could be sampled at the point when the target memory cell becomes activated. Alternatively, a boosted voltage could be applied to a first source/drain side of a target memory cell, and the threshold voltage could be taken as a difference between its control gate voltage and the voltage at its other source/drain side. By coupling the voltage to a capacitor, charge would be shared with the capacitor to store the sampled voltage. Note that the sampled voltage need not be equal to the threshold voltage, but merely indicative of that voltage. For example, in the case of applying a boosted voltage to a first source/drain side of the memory cell and a known voltage to its control gate, the voltage developed at the second source/drain side of the memory cell could be taken as the data signal as the developed voltage is indicative of the threshold voltage of the memory cell.

Sample and hold circuitry 118 may include caching, i.e., multiple storage locations for each data value, such that the memory device 101 may be reading a next data value while passing a first data value to the external processor, or receiving a next data value while writing a first data value to the memory array 104. A status register 122 is coupled between I/O control circuitry 112 and control logic 116 to latch the status information for output to the external processor.

Memory device 101 receives control signals at control logic 116 over a control link 132. The control signals may include a chip enable CE#, a command latch enable CLE, an address latch enable ALE, and a write enable WE#. Memory device 101 may receive commands (in the form of command signals), addresses (in the form of address signals), and data (in the form of data signals) from an external processor over a multiplexed input/output (I/O) bus 134 and output data to the external processor over I/O bus 134.

In a specific example, commands are received over input/output (I/O) pins [7:0] of I/O bus 134 at I/O control circuitry 112 and are written into command register 124. The addresses are received over input/output (I/O) pins [7:0] of bus 134 at I/O control circuitry 112 and are written into address register 114. The data may be received over input/output (I/O) pins [7:0] for a device capable of receiving eight parallel signals, or input/output (I/O) pins [15:0] for a device capable of receiving sixteen parallel signals, at I/O control circuitry 112 and are transferred to sample and hold circuitry 118. Data also may be output over input/output (I/O) pins [7:0] for a device capable of transmitting eight parallel signals or input/output (I/O) pins [15:0] for a device capable of transmitting sixteen parallel signals. It will be appreciated by those skilled in the art that additional circuitry and signals can be provided, and that the memory device of FIG. 1 has been simplified to help focus on the embodiments of the disclosure. Additionally, while the memory device of FIG. 1 has been described in accordance with popular conventions for receipt and output of the various signals, it is noted that the various embodiments are not limited by the specific signals and I/O configurations described unless expressly noted herein. For example, command and address signals could be received at inputs separate from those receiving the data signals, or data signals could be transmitted serially over a single I/O line of I/O bus 134. Because the data signals represent bit patterns instead of individual bits, serial communication of an 8-bit data signal could be as efficient as parallel communication of eight signals representing individual bits.

FIG. 2 is a schematic of a portion of an example NAND memory array 200 as might be found in the memory array 104 of FIG. 1. As shown in FIG. 2, the memory array 200 includes word lines 202 ₁ to 202 _(N) and intersecting bit lines 204 ₁ to 204 _(M). For ease of addressing in the digital environment, the number of word lines 202 and the number of bit lines 204 are generally each some power of two.

Memory array 200 includes NAND strings 206 ₁ to 206 _(M). Each NAND string includes transistors 208 ₁ to 208 _(N), each located at an intersection of a word line 202 and a bit line 204. The transistors 208, depicted as floating-gate transistors in FIG. 2, represent non-volatile memory cells for storage of data. The floating-gate transistors 208 of each NAND string 206 are connected in series source to drain between one or more source select gates 210, e.g., a field-effect transistor (FET), and one or more drain select gates 212, e.g., an FET. Each source select gate 210 is located at an intersection of a local bit line 204 and a source select line 214, while each drain select gate 212 is located at an intersection of a local bit line 204 and a drain select line 215.

A source of each source select gate 210 is connected to a common source line 216. The drain of each source select gate 210 is connected to the source of the first floating-gate transistor 208 of the corresponding NAND string 206. For example, the drain of source select gate 210 ₁ is connected to the source of floating-gate transistor 208 ₁ of the corresponding NAND string 206 ₁. A control gate of each source select gate 210 is connected to source select line 214. If multiple source select gates 210 are utilized for a given NAND string 206, they would be coupled in series between the common source line 216 and the first floating-gate transistor 208 of that NAND string 206.

The drain of each drain select gate 212 is connected to a local bit line 204 for the corresponding NAND string at a drain contact. For example, the drain of drain select gate 212 ₁ is connected to the local bit line 204 ₁ for the corresponding NAND string 206 ₁ at a drain contact. The source of each drain select gate 212 is connected to the drain of the last floating-gate transistor 208 of the corresponding NAND string 206. For example, the source of drain select gate 212 ₁ is connected to the drain of floating-gate transistor 208 _(N) of the corresponding NAND string 206 ₁. If multiple drain select gates 212 are utilized for a given NAND string 206, they would be coupled in series between the corresponding bit line 204 and the last floating-gate transistor 208 _(N) of that NAND string 206.

Typical construction of floating-gate transistors 208 includes a source 230 and a drain 232, a floating gate 234, and a control gate 236, as shown in FIG. 2. Floating-gate transistors 208 have their control gates 236 coupled to a word line 202. A column of the floating-gate transistors 208 are those NAND strings 206 coupled to a given local bit line 204. A row of the floating-gate transistors 208 are those transistors commonly coupled to a given word line 202. Other forms of transistors 208 may also be utilized with embodiments of the disclosure, such as NROM, magnetic or ferroelectric transistors and other transistors capable of being programmed to assume one of two or more threshold voltage ranges.

Memory devices of the various embodiments may be advantageously used in bulk storage devices. For various embodiments, these bulk storage devices may take on the same form factor and communication bus interface of traditional HDDs, thus allowing them to replace such drives in a variety of applications. Some common form factors for HDDs include the 3.5″, 2.5″ and PCMCIA (Personal Computer Memory Card International Association) form factors commonly used with current personal computers and larger digital media recorders, as well as 1.8″ and 1″ form factors commonly used in smaller personal appliances, such as mobile telephones, personal digital assistants (PDAs) and digital media players. Some common bus interfaces include universal serial bus (USB), AT attachment interface (ATA) [also known as integrated drive electronics or IDE], serial ATA (SATA), small computer systems interface (SCSI) and the Institute of Electrical and Electronics Engineers (IEEE) 1394 standard. While a variety of form factors and communication interfaces were listed, the embodiments are not limited to a specific form factor or communication standard. Furthermore, the embodiments need not conform to a HDD form factor or communication interface. FIG. 3 is a block schematic of a solid state bulk storage device 300 in accordance with one embodiment of the present disclosure.

The bulk storage device 300 includes a memory device 301 in accordance with an embodiment of the disclosure, a read/write channel 305 and a controller 310. The read/write channel 305 provides for analog-to-digital conversion of data signals received from the memory device 301 as well as digital-to-analog conversion of data signals received from the controller 310. The controller 310 provides for communication between the bulk storage device 300 and an external processor (not shown in FIG. 3) through bus interface 315. It is noted that the read/write channel 305 could service one or more additional memory devices, as depicted by memory device 301′ in dashed lines. Selection of a single memory device 301 for communication can be handled through a multi-bit chip enable signal or other multiplexing scheme.

The memory device 301 is coupled to a read/write channel 305 through an analog interface 320 and a digital interface 325. The analog interface 320 provides for the passage of analog data signals between the memory device 301 and the read/write channel 305 while the digital interface 325 provides for the passage of control signals, command signals and address signals from the read/write channel 305 to the memory device 301. The digital interface 325 may further provide for the passage of status signals from the memory device 301 to the read/write channel 305. The analog interface 320 and the digital interface 325 may share signal lines as noted with respect to the memory device 101 of FIG. 1. Although the embodiment of FIG. 3 depicts a dual analog/digital interface to the memory device, functionality of the read/write channel 305 could optionally be incorporated into the memory device 301 as discussed with respect to FIG. 1 such that the memory device 301 communicates directly with the controller 310 using only a digital interface for passage of control signals, command signals, status signals, address signals and data signals.

The read/write channel 305 is coupled to the controller 310 through one or more interfaces, such as a data interface 330 and a control interface 335. The data interface 330 provides for the passage of digital data signals between the read/write channel 305 and the controller 310. The control interface 335 provides for the passage of control signals, command signals and address signals from the controller 310 to the read/write channel 305. The control interface 335 may further provide for the passage of status signals from the read/write channel 305 to the controller 310. Status and command/control signals may also be passed directly between the controller 310 and the memory device 301 as depicted by the dashed line connecting the control interface 335 to the digital interface 325.

Although depicted as two distinct devices in FIG. 3, the functionality of the read/write channel 305 and the controller 310 could alternatively be performed by a single integrated circuit device. And while maintaining the memory device 301 as a separate device would provide more flexibility in adapting the embodiments to different form factors and communication interfaces, because it is also an integrated circuit device, the entire bulk storage device 300 could be fabricated as a single integrated circuit device.

The read/write channel 305 is a signal processor adapted to at least provide for conversion of a digital data stream to an analog data stream and vice versa. A digital data stream provides data signals in the form of binary voltage levels, i.e., a first voltage level indicative of a bit having a first binary data value, e.g., 0, and a second voltage level indicative of a bit having a second binary data value, e.g., 1. An analog data stream provides data signals in the form of analog voltages having more than two levels, with different voltage levels or ranges corresponding to different bit patterns of two or more bits. For example, in a system adapted to store two bits per memory cell, a first voltage level or range of voltage levels of an analog data stream could correspond to a bit pattern of 11, a second voltage level or range of voltage levels of an analog data stream could correspond to a bit pattern of 10, a third voltage level or range of voltage levels of an analog data stream could correspond to a bit pattern of 00 and a fourth voltage level or range of voltage levels of an analog data stream could correspond to a bit pattern of 01. Thus, one analog data signal in accordance with the various embodiments would be converted to two or more digital data signals, and vice versa.

In practice, control and command signals are received at the bus interface 315 for access of the memory device 301 through the controller 310. Addresses and data values may also be received at the bus interface 315 depending upon what type of access is desired, e.g., write, read, format, etc. In a shared bus system, the bus interface 315 would be coupled to a bus along with a variety of other devices. To direct communications to a specific device, an identification value may be placed on the bus indicating which device on the bus is to act upon a subsequent command. If the identification value matches the value taken on by the bulk storage device 300, the controller 310 would then accept the subsequent command at the bus interface 315. If the identification value did not match, the controller 310 would ignore the subsequent communication. Similarly, to avoid collisions on the bus, the various devices on a shared bus may instruct other devices to cease outbound communication while they individually take control of the bus. Protocols for bus sharing and collision avoidance are well known and will not be detailed herein. The controller 310 then passes the command, address and data signals on to the read/write channel 305 for processing. Note that the command, address and data signals passed from the controller 310 to the read/write channel 305 need not be the same signals received at the bus interface 315. For example, the communication standard for the bus interface 315 may differ from the communication standard of the read/write channel 305 or the memory device 301. In this situation, the controller 310 may translate the commands and/or addressing scheme prior to accessing the memory device 301. In addition, the controller 310 may provide for load leveling within the one or more memory devices 301, such that physical addresses of the memory devices 301 may change over time for a given logical address. Thus, the controller 310 would map the logical address from the external device to a physical address of a target memory device 301.

For write requests, in addition to the command and address signals, the controller 310 would pass digital data signals to the read/write channel 305. For example, for a 16-bit data word, the controller 310 would pass 16 individual signals having a first or second binary logic level. The read/write channel 305 would then convert the digital data signals to an analog data signal representative of the bit pattern of the digital data signals. To continue with the foregoing example, the read/write channel 305 would use a digital-to-analog conversion to convert the 16 individual digital data signals to a single analog signal having a potential level indicative of the desired 16-bit data pattern. For one embodiment, the analog data signal representative of the bit pattern of the digital data signals is indicative of a desired threshold voltage of the target memory cell. However, in programming of a one-transistor memory cells, it is often the case that programming of neighboring memory cells will increase the threshold voltage of previously programmed memory cells. Thus, for another embodiment, the read/write channel 305 can take into account these types of expected changes in the threshold voltage, and adjust the analog data signal to be indicative of a threshold voltage lower than the final desired threshold voltage. After conversion of the digital data signals from the controller 310, the read/write channel 305 would then pass the write command and address signals to the memory device 301 along with the analog data signals for use in programming the individual memory cells. Programming can occur on a cell-by-cell basis, but is generally performed for a page of data per operation. For a typical memory array architecture, a page of data includes every other memory cell coupled to a word line.

For read requests, the controller would pass command and address signals to the read/write channel 305. The read/write channel 305 would pass the read command and address signals to the memory device 301. In response, after performing the read operation, the memory device 301 would return the analog data signals indicative of the threshold voltages of the memory cells defined by the address signals and the read command. The memory device 301 may transfer its analog data signals in parallel or serial fashion.

The analog data signals may also be transferred not as discrete voltage pulses, but as a substantially continuous stream of analog signals. In this situation, the read/write channel 305 may employ signal processing similar to that used in HDD accessing called PRML or partial response, maximum likelihood. In PRML processing of a traditional HDD, the read head of the HDD outputs a stream of analog signals representative of flux reversals encountered during a read operation of the HDD platter. Rather than attempting to capture the true peaks and valleys of this analog signal generated in response to flux reversals encountered by the read head, the signal is periodically sampled to create a digital representation of the signal pattern. This digital representation can then be analyzed to determine the likely pattern of flux reversals responsible for generation of the analog signal pattern. This same type of processing can be utilized with embodiments of the present disclosure. By sampling the analog signal from the memory device 301, PRML processing can be employed to determine the likely pattern of threshold voltages responsible for generation of the analog signal.

FIG. 4 is a depiction of a wave form showing conceptually a data signal 450 as might be received from the memory device 301 by the read/write channel 305 in accordance with an embodiment of the disclosure. The data signal 450 could be periodically sampled and a digital representation of the data signal 450 can be created from the amplitudes of the sampled voltage levels. For one embodiment, the sampling could be synchronized to the data output such that sampling occurs during the steady-state portions of the data signal 450. Such an embodiment is depicted by the sampling as indicated by the dashed lines at times t1, t2, t3 and t4. However, if synchronized sampling becomes misaligned, values of the data samples may be significantly different than the steady-state values. In an alternate embodiment, sampling rates could be increased to allow determination of where steady-state values likely occurred, such as by observing slope changes indicated by the data samples. Such an embodiment is depicted by the sampling as indicated by the dashed lines at times t5, t6, t7 and t8, where a slope between data samples at times t6 and t7 may indicate a steady-state condition. In such an embodiment, a trade-off is made between sampling rate and accuracy of the representation. Higher sampling rates lead to more accurate representations, but also increase processing time. Regardless of whether sampling is synchronized to the data output or more frequent sampling is used, the digital representation can then be used to predict what incoming voltage levels were likely responsible for generating the analog signal pattern. In turn, the likely data values of the individual memory cells being read can be predicted from this expected pattern of incoming voltage levels.

Recognizing that errors will occur in the reading of data values from the memory device 301, the read/write channel 305 may include error correction. Error correction is commonly used in memory devices, as well as HDDs, to recover from expected errors. Typically, a memory device will store user data in a first set of locations and error correction code (ECC) in a second set of locations. During a read operation, both the user data and the ECC are read in response to a read request of the user data. Using known algorithms, the user data returned from the read operation is compared to the ECC. If the errors are within the limits of the ECC, the errors will be corrected.

FIG. 5 is a block schematic of an electronic system in accordance with an embodiment of the disclosure. Example electronic systems may include personal computers, PDAs, digital cameras, digital media players, digital recorders, electronic games, appliances, vehicles, wireless devices, mobile telephones and the like.

The electronic system includes a host processor 500 that may include cache memory 502 to increase the efficiency of the processor 500. The processor 500 is coupled to a communication bus 504. A variety of other devices may be coupled to the communication bus 504 under control of the processor 500. For example, the electronic system may include random access memory (RAM) 506; one or more input devices 508 such as keyboards, touch pads, pointing devices, etc.; an audio controller 510; a video controller 512; and one or more bulk storage devices 514. At least one bulk storage device 514 includes a digital bus interface 515 for communication with the bus 504, one or more memory devices in accordance with an embodiment of the disclosure having an analog interface for transfer of data signals representative of data patterns of two or more bits of data, and a signal processor adapted to perform digital-to-analog conversion of digital data signals received from the bus interface 515 and analog-to-digital conversion of analog data signals received from its memory device(s).

Programming Sequence in a Source Follower Read Mode

As stated above, sensing threshold voltages of memory cells of memories can be accomplished in multiple manners. In particular, one such method of analog sensing of memory cells in NAND architecture non-volatile memory devices and arrays is detailed in United States Patent Application No. (Attorney Docket No. 400.507US01), titled “SENSING OF MEMORY CELLS IN NAND FLASH,” filed ______, 2007, which is commonly assigned.

In source follower read mode sensing one or more embodiments, a pass voltage (Vpass) is applied to the unselected word lines of a NAND memory cell string to operate the unselected transistors as pass transistors while a boosted voltage (Vsource, such as Vcc +) is applied to the source line of the NAND string. A voltage (Vout) is then expressed on a coupled bit line by the target memory cell. The bit line voltage (Vout) set by the target memory cell should then be the control gate voltage (Vg) of the target memory cell minus the programmed threshold voltage (Vt) of the target memory cell (Vout=Vg−Vt). The threshold voltage of the target memory cell can then be determined as the difference between the control gate voltage (Vg) and the voltage (Vout) expressed on the coupled bit line, Vt=Vg−Vout. In addition, it is noted that in alternate embodiments, the bit line can also be precharged to a known precharge voltage level before being coupled to the NAND string, such as to aide sensing speed and accuracy.

FIG. 6A details a read mode in a NAND architecture Flash memory. In FIG. 6A, a NAND memory string of an array contains a series of memory cells 208 ₀-208 ₃₁ that are coupled together source to drain to form the NAND string, and which are selectively coupled to bit line 204 and source line 216. It is noted that, while the NAND string of FIG. 6A is detailed as having 32 cells in it, NAND strings can have differing numbers of cells, including, but not limited to, 8, 16, 32, 64, or more cells. As described above, each memory cell FET 208 _(X) has a gate-insulator stack formed over a channel region. The word lines 202 _(X) couple across the NAND strings of the array, coupling the control gates of adjacent memory cells 208 _(X) and enabling a single memory cell 208 _(X) in each of the memory strings to be selected. In each NAND memory string, impurity (N+ typically for N-FET based floating gate memory cells, P+ for P-FET based cells) doped regions are formed between each gate insulator stack to form the source and drain regions of the adjacent memory cells 208 _(X) of the string, which additionally operate as connectors to couple the cells of the NAND string together. Each NAND memory string is coupled to select gates 210, 212 that are formed at either end of each NAND string and selectively couple the string to a bit line 204 and a source line 216.

In a source follower sense or read operation, an elevated read pass voltage (Vpass, such as Vcc or higher) is coupled to the word lines of the unselected memory cells (208 ₃₁-208 _(N+1), 208 _(N−1)-208 ₀, coupled to word lines 202 ₃₁-202 _(N+1), 202 _(N−1)-202 ₀), allowing the unselected cells to pass current in a manner that is unrestricted by their programmed threshold voltages/stored data values. An elevated voltage, Vsource, (such as Vcc or higher) is applied to the source line 216. Select gate voltages (V_(SGD) and V_(SGS)) are also applied to the gates of the select gate transistors, coupling the NAND string to the source line 216 and bit line 204, respectively. A read gate voltage (Vg) is applied to the word line 202 _(N) connected to the control gate of the selected memory cell 208 _(N), placing it in an active mode of operation. Current (I bias) then flows through the NAND string from the source line 216 to the bit line 204 through the selected memory cell 208 _(N), raising the voltage (Vout) of the bit line 204 to that of the read gate voltage minus the programmed threshold voltage (Vout=Vg−Vt, such that Vt=Vg−Vout) of the selected cell 208 _(N). As the applied read gate voltage is known, the threshold voltage (Vt) of the selected cell 208 _(N) can be directly sensed from the bit line 204, or sampled by an analog to digital converter (ADC) or sampled and held by a capacitor in a sample and hold circuit 118 for comparison or transfer from the memory device.

However, a potential problem with such source follower sensing is that the unselected memory cells (208 ₃₁-208 _(N+1) on the source-side of the selected memory cell 208 _(N), and 208 _(N−1)-208 ₀ on the drain-side) may not act as perfect pass gates and could introduce an additional voltage drop into the sensing operation, such as that due to their internal channel resistance. As shown in FIG. 6B, the unselected cells (208 ₃₁-208 _(N+1) and 208 _(N−1)-208 ₀) of the memory string can be represented as resistances 602, 604 placed both above and below the selected memory cell 208 _(N). In a source follower sensing operation, the selected memory cell of the NAND string acts as a source follower amplifier. Thus, the source-side resistance 602, emanating from the channel resistance of the source-side unselected memory cells 208 ₃₁-208 _(N+1), will induce a sensing error due to the IR voltage drop across the source-side resistance 602. Sensing errors from the channel resistance of the unselected cells will be predominately due to source-side resistance 602, while drain-side resistance 604 will only have a minor or secondary effect. The voltage expressed on the bit line 204 can thus be approximated as that of the applied read gate voltage (Vg) applied to the selected memory cell minus the programmed threshold voltage (Vt) of the selected memory cell minus the IR voltage drop (Rsource-side*I bias) of the source-side unselected cells (Vout=Vg−Vt−Rsource-side*I bias), if one ignores the sensing error of the smaller IR drop of the drain-side unselected memory cells 208 _(N−1)-208 ₀.

It is noted that the threshold voltage programmed into the selected memory cell can therefore be compensated to account for this inherent unselected cell NAND string resistance by utilizing the same sensing method for verification as used in reading the memory cell, so that the selected memory cell is programmed such that it compensates for NAND string resistance and the voltage read/verified on the bit line corresponds to the target voltage being programmed. Thus, the selected memory cell should be programmed such that Vtarget=Vg−Vout=Vt+I bias*Rsource-side.

As stated above, this programming can be accomplished by programming memory cells by applying a programming voltage or series of programming voltage pulses to the control gates of the selected memory cells of one or more NAND strings to store charge in their floating gates. The programmed threshold voltages are then verified against the target voltage levels stored in the sample and hold circuit 118 in a verify operation. The memory cells that are at or over their target voltage can be inhibited from further programming by the application of an elevated voltage to their channels (such as through the coupled bit line 204), while the cells that failed verification (had a Vt that was below the target analog voltage, or as stated above, Vtarget>Vg−Vout=Vt+I bias*Rsource-side) have their channels coupled to a low programming voltage (typically by coupling the channel to ground through the bit line 204) and are subjected to additional programming pulses (at the programming word line voltage or at an increased programming voltage). This program and verify cycle is repeated until the target analog voltages are successfully programmed or a selected number of iterations have passed and the programming operation is deemed to have failed.

Unfortunately, the channel resistance of memory cells also generally increases as their programmed threshold voltage is changed from an erased state to fully programmed. As such, the resistance of the unselected memory cells can vary as data is stored and the NAND memory string is programmed. This can leave the cells programmed first in a very different NAND string resistance environment than when they were verified, changing the voltage read on the bit line in sensing operations and materially increasing the chances of a mis-read and data corruption. Thus, if the NAND string resistance environment can be stabilized, so that programming and verification occurs in the same resistance environment as any subsequent reads, sensing accuracy and repeatability should be increased. In addition, any string resistance compensation of the programmed threshold voltages of the memory cells will be maintained. This string resistance stabilization can be accomplished through using a programming sequence of the memory cells of the string that ensures a stable resistance pattern in the unselected cells (208 ₃₁-208 _(N+1), 208 _(N−1)-208 ₀) during programming, verifying and reading a given memory cell 208 _(N). In particular, if the resistance presented by the source-side unselected memory cells 208 ₃₁-208 _(N+1) of strings of NAND architecture memories can be maintained the same between the program-verify operation and later read operations, read accuracy will be increased.

One or more embodiments of the present invention therefore involve programming the cells in NAND memory cell strings, such as those in NAND architecture Flash memory arrays of NAND Flash memory devices, to maintain the stability of the unselected cell resistance presented on the source-side of a given selected memory cell of the NAND string during both verify and read. In particular, in one embodiment of the present invention, the cells in the NAND string are programmed sequentially in source-side order from the cell adjacent to the bit line to the cell that is adjacent the source line. This allows the sensing of the verify and read operations to read the programmed threshold voltage across the same stable source-side resistance 602, as the source-side unselected memory cells 208 ₃₁-208 _(N+1) will already have been programmed. This stable source-side unselected cell resistance maintains the threshold voltage compensation of the selected cell 208 _(N) for the source-side resistance 602 of the source-side unselected memory cells 208 ₃₁-208 _(N+1). It is noted that the resistance 604 of drain-side unselected memory cells 208 _(N−1)-208 ₀ will vary in this approach due to their later programming, but, as noted above, will not have as great an effect on sensing accuracy as the source-side unselected memory cells 602.

For example, in the embodiments of FIGS. 6A and 6B, the memory cells 208 ₀-208 ₃₁ of the NAND string are programmed and verified in sequence from memory cell 208 ₃₁, closest to the bit line 204, to memory cell 208 ₀, closest to the source line 216, allowing the source-side resistance of the source-side unselected cells 208 ₃₁-208 _(N+1) to remain stable during both verify and read sensing operations. It is noted that other programming patterns that maintain the relative stability of the resistance of the unselected memory cells of the NAND string, such as sequentially programming alternating even and odd numbered memory cells in the NAND string or utilizing virtual ground strings or P-FET based floating gate memory cells with opposite source/drain configurations, are possible and will be apparent to those skilled in the art with the benefit of the present disclosure.

Although specific embodiments have been illustrated and described herein, it will be appreciated by those of ordinary skill in the art that any arrangement that is calculated to achieve the same purpose may be substituted for the specific embodiments shown. Many adaptations of the disclosure will be apparent to those of ordinary skill in the art. Accordingly, this application is intended to cover any adaptations or variations of the disclosure.

Conclusion

A NAND architecture non-volatile memory device and programming process has been described that reduce the effects of NAND string resistance in source follower sensing by programming the cells in NAND memory cell strings to maintain the resistance presented by the unselected cells on the source-side of a given selected memory cell of the NAND string during both the verify and read, maintaining the sensing environment and string resistance compensation. In particular, in one embodiment of the present invention, the cells in the NAND string are programmed sequentially in order from the cells closest the bit line to the final cell that is closest the source line in the string. This allows the source follower sensing of the verify and later read operations to read the programmed threshold voltage across the same stable source-side resistance 602, as the source-side unselected memory cells 208 ₃₁-208 _(N+1) will already have been programmed and thus will present the same channel resistance to both the source follower verify of the program operation and following source follower read operations, maintaining the compensation for the source-side resistance 602 of the source-side unselected memory cells 208 ₃₁-208 _(N+1).

Although specific embodiments have been illustrated and described herein, it will be appreciated by those of ordinary skill in the art that any arrangement that is calculated to achieve the same purpose may be substituted for the specific embodiments shown. Many adaptations of the invention will be apparent to those of ordinary skill in the art. Accordingly, this application is intended to cover any adaptations or variations of the invention. It is manifestly intended that this invention be limited only by the following claims and equivalents thereof. 

1. A method of programming a target memory cell of a series string of memory cells coupled source to drain, the method comprising: programming the target memory cell after programming each memory cell of the string located between the target memory cell and a first end of the string; and verifying the programming of the target memory cell by applying a bias at a second end of the string opposite the first end and sensing a voltage developed at the first end in response to the bias.
 2. The method of claim 1, wherein programming the target memory cell after programming each memory cell of the string located between the target memory cell and a first end of the string comprises applying programming pulses to the target memory cell to obtain a target data state for the target memory cell while each memory cell of the string located between the target memory cell and the first end of the string is in its respective target data state.
 3. The method of claim 1, further comprising: after programming the target memory cell, programming a next memory cell of the string; wherein the next memory cell is located immediately adjacent the target memory cell between the target memory cell and the second end of the string.
 4. The method of claim 1, wherein programming the target memory cell and verifying the programming of the target memory cell comprises: applying programming pulses to the target memory cell to increase a threshold voltage of the target memory cell; determining the threshold voltage of the target memory cell; comparing the determined threshold voltage of the target memory cell to a target voltage level; and re-applying programming pulses to the target memory cell if its determined threshold voltage is less than the target voltage level.
 5. The method of claim 1, wherein verifying the programming of the target memory cell comprises: applying a first voltage at the second end of the string; activating each memory cell of the string other than the target memory cell as a pass transistor; and applying a second voltage to a control gate of the target memory cell.
 6. The method of claim 5, wherein verifying the programming of the target memory cell further comprises: indicating successful programming of the target memory cell if the voltage developed at the first end of the string minus the first voltage applied to the second end of the string is greater than or equal to a target voltage for the target memory cell.
 7. The method of claim 5, wherein applying a second voltage to a control gate of the target memory cell comprises applying a second voltage having a value less than a value of the first voltage.
 8. The method of claim 7, wherein applying the first voltage comprises applying a voltage greater than or equal to a supply potential.
 9. A method of programming a series string of memory cells coupled source to drain, comprising: programming memory cells of the string in a sequence from a first end to a second end opposite the first end; and verifying the programming of the memory cells of the string individually in sequence by applying a bias at the opposing end of the string and sensing a voltage developed at the first end of the string in response to the bias.
 10. The method of claim 9, wherein the first end of the string is selectively coupled to a bit line and the second end of the string is selectively coupled to a source line.
 11. The method of claim 10, wherein verifying the programming of a particular memory cell of the string comprises: applying a first voltage to the source line; coupling the string to the source line; coupling the string to the bit line activating each memory cell of the string other than the particular memory cell as a pass transistor; applying a second voltage to a control gate of the particular memory cell, wherein the second voltage is less than the first voltage; and determining a threshold voltage of the particular memory cell to be a value of the second voltage minus the voltage developed at the first end of the string.
 12. The method of claim 11, further comprising: determining that the particular memory cell has been successfully programmed if the determined threshold voltage is greater than or equal to a target threshold voltage.
 13. The method of claim 10, wherein programming memory cells of the string in a sequence from a first end to a second end opposite the first end comprises programming memory cells of a NAND string of memory cells in a sequence from a first memory cell adjacent the bit line to a last memory cell adjacent the source line.
 14. A method of programming a series string of memory cells coupled source to drain, comprising: programming memory cells of the string in a sequence from a first end, selectively coupled to a bit line, to a second end, selectively coupled to a source line; wherein the programming of any particular memory cell of the string during a particular programming operation occurs after each memory cell of the string between that particular memory cell and the bit line has been programmed to a target data state; wherein the programming of that particular memory cell occurs before each memory cell of the string between that particular memory cell and the source line has been programmed to a target data state; wherein verifying the programming of that particular memory cell is performed while each memory cell of the string between that particular memory cell and the bit line is in its target data state; and wherein verifying the programming of that particular memory cell comprises applying a bias to the source line and sensing a voltage developed at the bit line in response to the bias.
 15. The method of claim 14, further comprising: after programming that particular memory cell, programming a next memory cell of the string; wherein the next memory cell is located immediately adjacent that particular memory cell between that particular memory cell and the source line.
 16. The method of claim 14, wherein programming that particular memory cell and verifying the programming of that particular memory cell comprises: applying programming pulses to that particular memory cell to increase a threshold voltage of that particular memory cell; determining the threshold voltage of that particular memory cell; comparing the determined threshold voltage of that particular memory cell to a target voltage level; and re-applying programming pulses to that particular memory cell if its determined threshold voltage is less than the target voltage level.
 17. The method of claim 14, wherein verifying the programming of that particular memory cell comprises: applying a first voltage to the source line; coupling the string to the source line; coupling the string to the bit line activating each memory cell of the string other than that particular memory cell as a pass transistor; applying a second voltage to a control gate of that particular memory cell, wherein the second voltage is less than the first voltage; and determining a threshold voltage of that particular memory cell to be a value of the second voltage minus the voltage developed at the bit line.
 18. The method of claim 17, wherein applying a first voltage to the source line and applying a second voltage to a control gate of the particular memory cell comprises applying the first voltage having a value greater than a supply potential and applying the second voltage having a value greater than or equal to the supply potential, wherein the value of the first voltage is greater than the value of the second voltage.
 19. The method of claim 17, further comprising: determining that that particular memory cell has been successfully programmed if the determined threshold voltage is greater than or equal to a target threshold voltage.
 20. The method of claim 14, wherein programming memory cells of the string in a sequence from a first end, selectively coupled to a bit line, to a second end, selectively coupled to a source line comprises programming memory cells of a NAND string of memory cells in a sequence from a first memory cell adjacent the bit line to a last memory cell adjacent the source line. 